User talk:Jaymody
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Proposed deletion of Conductive atomic force microscopy
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The article Conductive atomic force microscopy has been proposed for deletion because of the following concern:
- Expert entry, probable copyvio, see talk
While all contributions to Wikipedia are appreciated, content or articles may be deleted for any of several reasons.
You may prevent the proposed deletion by removing the {{dated prod}} notice, but please explain why in your edit summary or on the article's talk page.
Please consider improving the article to address the issues raised. Removing {{dated prod}} will stop the Proposed Deletion process, but other deletion processes exist. The Speedy Deletion process can result in deletion without discussion, and Articles for Deletion allows discussion to reach consensus for deletion. Hairhorn (talk) 12:06, 7 October 2009 (UTC)
Are you the original author of this article? It seems to have uncredited text from "Effect of N2 anneal on thin HfO2 layers studied by conductive atomic force microscopy". Hairhorn (talk) 21:58, 8 October 2009 (UTC)
January 2010
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Please do not intentionally introduce incorrect information to pages, as you did with this edit to Mohammed bin Rashid Al Maktoum. If you continue to do so, you will be blocked from editing. Shadowjams (talk) 12:11, 4 January 2010 (UTC)