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Scanning probe microscopy
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From Wikipedia, the free encyclopedia
v
t
e
Scanning probe microscopy
Common
Atomic force
Conductive
Infrared
Non-contact
Photoconductive
Scanning tunneling
Electrochemical
Spin polarized
Typical atomic force microscopy set-up
Other
Ballistic electron emission
Chemical force
Electrostatic force
Kelvin probe force
Magnetic force
Magnetic resonance force
Near-field scanning optical
Nano-FTIR
Photon scanning
Photothermal microspectroscopy
Piezoresponse force
Scanning capacitance
Scanning electrochemical
Scanning gate
Scanning Hall probe
Scanning ion-conductance
Scanning joule expansion
Scanning Kelvin probe
Scanning quantum dot microscopy
Scanning SQUID microscope
Scanning SQUID microscopy
Scanning thermal
Scanning voltage
Applications
Scanning probe lithography
Dip-pen nanolithography
Feature-oriented scanning
Millipede memory
See also
Nanotechnology
Microscope
Microscopy
Vibrational analysis
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