Talk:Flatness (manufacturing)
 | Whitworth's three plates method was nominated for deletion. The discussion was closed on 27 September 2024 with a consensus to merge. Its contents were merged into Flatness (manufacturing). The original page is now a redirect to this page. For the contribution history and old versions of the redirected article, please see its history; for its talk page, see here. |
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Geometric Dimensioning and Tolerancing
[edit]This article needs to reference "flatness" as used in Geometric Dimensioning and Tolerancing.
F3meyer (talk) 16:53, 13 June 2011 (UTC)
- You're right. This is very important as GD&T is the only thing that provides an operational definition once you get down on the microscopic scale (AFAIK). I added a basic mention of GD&T to the article. But of course the details will need to be filled in over time as anyone is able. — ¾-10 00:29, 14 June 2011 (UTC)
Semiconductor Manufacturing Flatness
[edit]The article needs to reference the different definitions of flatness used in semiconductor manufacturing, their measurement, and relation to one another.
F3meyer (talk) 16:53, 13 June 2011 (UTC)
Material merged from Whitworth's three plates method
[edit]Copied material from Whitworth's three plates method, edits mainly from the page originator User:Amomchilov, see the talk page of that redirect for full credit information. There was an AfD discussion for that page, which concluded with a merge/redirect result. Please note that some further editing may be appropriate. Ldm1954 (talk) 17:07, 27 September 2024 (UTC)