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Wafer probing merge

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Wafer probing can also be done in manually operated stand alone systems for first article inspection work. Burying wafer probing in automatic test will loose visibility to manual probing. —The preceding unsigned comment was added by 71.223.6.55 (talk • contribs) 20:20, 16 January 2007.

I would suggest that Wafer prober and Wafer testing be merged. Possibly merge those into Wafer (electronics) as well. All that wafer stuff is obviously fairly closely related. I would say these wafer topics do not belong under Automatic test equipment. I am going to put merge boxes to that effect on the appropriate articles. —DragonHawk (talk) 05:33, 17 January 2007 (UTC)[reply]

I agree that wafer probing is a subset of ATE, but these articles should definitely NOT be merged. --Rbenech 03:06, 25 January 2007 (UTC)[reply]

Wafer probing investigates if the device has passed the engineering specifications for proper transistor operation and to validate other process parameters. No attempt is typically made to carefully assess the complete circuit functionality nor the functionality at speed. Transistor testing is typically done in a manual or semiautomatic fashion and involves a good deal of electrical engineering feedback to process engineering. There is a further level of wafer scale ATE testing that is much more at the heart of manufacturing, where full functionality of the die is investigated but again, no attempt is made (typically)to assess the functionality at speed. On the basis of this test, die are identified for packaging. Simplified transistor testing is associated with this test as well and is the basis for the speed test pass at this stage. After packaging micro devices are inspected with an ATE system and more realistic testing, possibility including full function at speed, or full function at some slower speed that is acceptable to both manufacturer and buyer is done. There is a clear distinction between the transistor level tests and the ATE die function tests, and (often) a completely different set of test equipment. Separation seems supportable. 64.122.171.194 23:56, 14 March 2007 (UTC)[reply]

Mechanical vs Electrical only

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Proposal for merge to Electronic test equipment

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I propose to merge automatic test equipment (ATE) to electronic test equipment (ETE). The reason is that the ATE article currently fails to differentiate ATEs from normal ETE. Besides this, the ATE article fails to explain what makes an ATE automatic.
In case you see good reasons to keep the articles separate, then please

  1. discuss these reasons here,
  2. modify both articles in such a way that precise and different definitions are given,
  3. modify both articles in such a way that both articles explicitly mention each other and show the difference between both terms,
  4. remove the merge templates from both articles.

Thanks, --Abdull (talk) 21:36, 10 February 2010 (UTC)[reply]


I disagree. ETE are building blocks of ATE, but an ATE are not entirely made of ETEs. Each one deserve its own article. I'll work the ATE article during the following days to clear up things. Enrique Vargas (talk) 19:20, 10 March 2010 (UTC)[reply]
I also disagree with the merge proposal I think ATE should be separate from ETE. Electronic test equipment is not automated. The goal of ATE is to improve the speed of test beyond what a normal electronic test equipment tool could provide. ATE typically requires mechanical handlers to pick and place the devices on the test equipment much faster than what could be done by hand. So it could be said that All ATE is ETE, but all ETE most definitely is NOT ATE. --Rbenech (talk) 23:45, 19 April 2010 (UTC)[reply]
Completed removal of merge templates... --Rbenech (talk) 18:42, 18 May 2010 (UTC)[reply]

Typical vendors

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The Automatic test equipment#Typical vendors section doesn't add to the article. It's just a collection of links to random companies. The entire section should be deleted. Glrx (talk) 21:11, 5 January 2011 (UTC)[reply]

Simulate / Stimulate possible typo?

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At the end of the Automatic test equipment#Industrial PC section, it mentions: "…for simulation and signal capturing." Should that be 'stimulation' instead of simulation? As in stimulating the UUT and capturing the output signal… (This is my first talk page submission, hope I've done it right :P ) Heddmj (talk) 18:25, 22 September 2012 (UTC)[reply]

DPS acronym

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There are plenty of other sources available that support DPS as being the acronym for "Device Power Supplies" but I thought adding more would be pointy. It's not doubtful that there are power supplies that are "digital" but in terms of ATE, there's no question that DPS means Device Power Supplies. Mkdwtalk 15:32, 12 October 2015 (UTC)[reply]

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Hello fellow Wikipedians,

I have just modified 2 external links on Automatic test equipment. Please take a moment to review my edit. If you have any questions, or need the bot to ignore the links, or the page altogether, please visit this simple FaQ for additional information. I made the following changes:

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Title picture

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The title picture seems unrelated to the subject 134.50.131.72 (talk) 21:37, 11 February 2024 (UTC)[reply]

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