File:Thickness Measurement.png
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Summary
| Description |
English: The transmitted THz pulse in reflection mode experiment setup are received by the detector with different time delays; X-ray image of the IC from the side and relating the detected peaks in THz to the different layers detected by X-ray is shown as well. |
| Date | |
| Source | Own work |
| Author | KiarashKevin86 |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 11:13, 30 June 2015 | | 1,232 × 506 (233 KB) | KiarashKevin86 | User created page with UploadWizard |
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