DescriptionStem dpc schematic magnetic explanation.jpg
English: In Scanning Transmission Electron Microscopy (STEM) it is possible image magnetic fields using a technique called differential phase contrast, which relies on the electron beam being deflected by the magnetic field. This figure shows a schematic of this, with an electron beam passing through two different regions in a material, where the magnetic domains point in opposite directions. This leads to a beam deflection which can be imaged on a camera, represented by the grid patterns towards the bottom of the plot.
In a real STEM the electron beam would be scanning in a raster pattern across the material, and the detector would be far away from the material.
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