English: Silicon atoms observed at the surface of a silicon carbide (SIC) crystal using a Scanning Tunneling Microscope (STM)
Français : Atomes de silicium observés à la surface d'un cristal de carbure de silicium (SiC) à l'aide d'un microscope à effet tunnel (STM)
Date
Source
Image de microscopie à effet tunnel réalisée au lppm à Orsay
Author
Guillaume Baffou
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{{Information |Description={{en|1=Silicon atoms observed at the surface of a silicon carbide (SIC) crystal using a Scanning Tunneling Microscope (STM)}} {{fr|1=Atomes de silicium observés à la surface d'un cristal de carbure de silicium (SiC) à l'aide