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Summary

Description

Title: SIMS - Secondary Ion Mass Spectrometry, instrument scheme

  • Author: Twisp
  • Date: 06.02.2006
Date 6 February 2006 (original upload date)
Source No machine-readable source provided. Own work assumed (based on copyright claims).
Author No machine-readable author provided. Twisp assumed (based on copyright claims).

Summary

  1. Cesium ion source
  2. Duoplasmatron
  3. Electrostatic lens
  4. Sample
  5. Electrostatic sector - ion energy analyser
  6. Electromagnet - mass analyser
  7. Electron multiplier / Faraday cup
  8. Channel-plate / Fluorescent screen - ion image detector

Licensing

Public domain I, the copyright holder of this work, release this work into the public domain. This applies worldwide.
In some countries this may not be legally possible; if so:
I grant anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law.

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6 February 2006

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Date/TimeThumbnailDimensionsUserComment
current20:13, 24 July 2015Thumbnail for version as of 20:13, 24 July 2015600 × 600 (64 KB)CmdrjamesonCompressed with pngout. Reduced by 23kB (26% decrease).
17:49, 6 February 2006Thumbnail for version as of 17:49, 6 February 2006600 × 600 (87 KB)Twisp* Title: SIMS - Secondary Ion Mass Spectrometry, instrument scheme * Author: Twisp * Date: 06.02.2006

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