File:SEM SE vs BE Zr Al.png

The image illustrates two different scanning modes of a scanning electron microscope (SEM). In the lower part of the image, we can see the relief of the sample. This is obtained using the detection of secondary electrons. In the upper part of the image, we can see light spots surrounded by darker areas. The light spots correspond to the zirconium aggregates in an aluminium matrix. This is obtained using the detection of backscattered electrons.

Author: Twisp

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