File:Photoconductance decay measurement.svg
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Summary
| Description |
English: A chart of Minority Carrier Lifetime (no Auger Correction) vs. Minority Carrier Density used in Photoconductance decay measurement. This example PCD measurement was conducted on a p-type float zone silicon wafer passivated with a 10 nm amorphous silicon coating.
with evaluated at to 660 μs. |
| Date | |
| Source | Own work |
| Author | Radiotrefoil |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 00:23, 1 February 2023 | | 732 × 512 (17 KB) | Radiotrefoil | Uploaded own work with UploadWizard |
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