File:GrapheneonSiC-brightfield-darkfield-LEEM.png
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Summary
| Description |
English: Graphene on SiC is composed of domains of different stacking order. (left) Bright-field LEEM micrograph of a samples of bilayer, trilayer, and four-layer intercalated graphene. (right) Dark-field images of the same area. Domains of alternating contrast are clearly visible, indicating areas of different stacking order. Adapted from doi:10.1103/PhysRevMaterials.2.104005 |
| Date | |
| Source | https://doi.org/10.1103/PhysRevMaterials.2.104005 |
| Author | T. A. de Jong, E. E. Krasovskii, C. Ott, R. M. Tromp, S. J. van der Molen, and J. Jobst |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 13:16, 31 January 2020 | | 1,288 × 583 (730 KB) | TobiasdeJong | User created page with UploadWizard |
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